Interface Carriers and Enhanced Electron-Phonon Coupling Effect in Al2O3/TiO2 Heterostructure Revealed by Resonant Inelastic Soft X-Ray Scattering

Yu-Cheng Shao, Cheng-Tai Kuo,* Xuefei Feng, Yi-De Chuang, Tae Jun Seok, Ji Hyeon Choi, Tae Joo Park, and Deok-Yong Cho*